Home> Online Review System
 
 
Subject Keyword Abstract Author
 
 
Electronic Materials Letters, Volume 4, Number 2, June, 2008
Grain Boundary Incorporation of Interstitial Oxygen in Polycrystalline Si Film by Plasma Oxidation and its Effect on Thin Film Transistors
Bo Hyun Kim, Seung Ryul Lee, Kyung Min Ahn, and Byung Tae Ahn*
Electronic Materials Letters, vol. 4, no. 2, pp. 45-49, June, 2008
Crystallization of Amorphous-Silicon by Seed Layer and its Polycrystalline-Silicon Thin Film Transistors
Bong-Kwan Shin, Young-Su Kim, Jae-Hwan Kwon, Se-Wan Son, Seong-Hoon Yoo, Yong-Woo Lee, Jin-Hyun Park, and Seung-Ki Joo*
Electronic Materials Letters, vol. 4, no. 2, pp. 51-55, June, 2008
Electrical Properties of Transparent Conductive CNT Composite Films
Mun Ja Kim and Ji-Beom Yoo*
Electronic Materials Letters, vol. 4, no. 2, pp. 57-61, June, 2008
Increase of Quantum Efficiency in Organic Light Emitting Diodes with Mg-Al Alloy Cathode and RhO2-Coated ITO Anode
Soo Young Kim, Kihyon Hong, Kisoo Kim, and Jong-Lam Lee*
Electronic Materials Letters, vol. 4, no. 2, pp. 63-66, June, 2008
Structural and Optical Properties of InGaN/GaN Single Quantum Well Grown via MOCVD
Seung-Kyu Choi1, Jae Min Jang1, Woo-Gwang Jung1,*, Jin-Yeol Kim1, and Sung-Dai Kim2
Electronic Materials Letters, vol. 4, no. 2, pp. 67-70, June, 2008
Influence of ZnO Seed Layers on Charge Transport in ZnO Nanorod-based Dye-Sensitized Solar Cells
Jun Hong Noh1, Sung Hae Lee2, Sangwook Lee1, and Hyun Suk Jung2,*
Electronic Materials Letters, vol. 4, no. 2, pp. 71-74, June, 2008
Formation of Nanoporous Pt Thin Films by Electrochemical Dissolution
Chunjoong Kim, Yejun Park, Changwoo Nahm, and Byungwoo Park*
Electronic Materials Letters, vol. 4, no. 2, pp. 75-77, June, 2008
The Effect of Doping on Metal-Induced Lateral Crystallization Rate
Chang-Woo Byun*, Yong-Woo Lee, Jin-Hyun Park, Chul-Kyun Seok, Young-Soo Kim, and Seung-Ki Joo
Electronic Materials Letters, vol. 4, no. 2, pp. 79-83, June, 2008
Protrusive Morphology of Bis(triisopropylsilylethynyl)Pentacene Nanofilms Deposited on SiO2 Surfaces via the Vacuum Thermal Evaporation Method
Tae Kwan Kim2, Hoesup Soh3, Hyunho Kim1, Sungsoo Kim1,*, and Jaegab Lee1
Electronic Materials Letters, vol. 4, no. 2, pp. 85-89, June, 2008